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Test results and irradiation performances of 3-D circuits developed in the framework of ATLAS hybrid pixel upgrade

Schnelle Fakten

  • Interne Autorenschaft

  • Weitere Publizierende

    P. Pangaud, D. Arutinov, M. Barbero, P. Breugnon, B. Chantepie, J. C. Clemens, R. Fei, D. Fougeron, M. Garcia-Sciveres, S. Godiot, T. Hemperek, H. Kruger, A. Mekkaoui, L. Perrot, S. Rozanov, N. Wermes

  • Veröffentlichung

    • 2010
    • Band 2010 IEEE Nuclear Science Symposium Conference Record
  • Titel des Konferenzbands

    2010 IEEE Nuclear Science Symposium Conference Record

  • Organisationseinheit

  • Fachgebiete

    • Allgemeine Elektrotechnik
  • Format

    Konferenzpaper

Zitat

P. Pangaud, D. Arutinov, M. Barbero, P. Breugnon, B. Chantepie, J. C. Clemens, R. Fei, D. Fougeron, M. Garcia-Sciveres, S. Godiot, T. Hemperek, M. Karagounis, H. Kruger, A. Mekkaoui, L. Perrot, S. Rozanov, and N. Wermes, “Test results and irradiation performances of 3-D circuits developed in the framework of ATLAS hybrid pixel upgrade,” in 2010 IEEE Nuclear Science Symposium Conference Record, 2010, pp. 1551–1555.

Abstract

Vertex detectors for High Energy Physics experiments require pixel detectors featuring high spatial resolution, very good signal to noise ratio and radiation hardness. A way to face new challenges of ATLAS/SLHC future hybrid pixel vertex detectors is to use the emerging 3-D Integrated Technologies. However, commercial offers of such technologies are only very few and the 3-D designer’s choice is then hardly constrained. Moreover, as radiation hardness and specially SEU tolerance of configuration registers is a crucial issue for SLHC vertex detectors and, as commercial data on this point are always missing, a reliable qualification program is to be developed for any candidate technology. We will present the design and test (including radiation tests with 70 kV, 60W X-Ray source and 24 GeV protons) of Chartered, 130nm Low Power 2-D chips realized for this qualification.

Schlagwörter

Detectors

Latches

Layout

MOS devices

Pixel

Radiation effects

Transistors

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