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Test results and irradiation performances of 3-D circuits developed in the framework of ATLAS hybrid pixel upgrade

Fast facts

  • Internal authorship

  • Further publishers

    P. Pangaud, D. Arutinov, M. Barbero, P. Breugnon, B. Chantepie, J. C. Clemens, R. Fei, D. Fougeron, M. Garcia-Sciveres, S. Godiot, T. Hemperek, H. Kruger, A. Mekkaoui, L. Perrot, S. Rozanov, N. Wermes

  • Publishment

    • 2010
    • Volume 2010 IEEE Nuclear Science Symposium Conference Record
  • Title of the conference proceedings

    2010 IEEE Nuclear Science Symposium Conference Record

  • Organizational unit

  • Subjects

    • General electrical engineering
  • Publication format

    Conference paper

Quote

P. Pangaud, D. Arutinov, M. Barbero, P. Breugnon, B. Chantepie, J. C. Clemens, R. Fei, D. Fougeron, M. Garcia-Sciveres, S. Godiot, T. Hemperek, M. Karagounis, H. Kruger, A. Mekkaoui, L. Perrot, S. Rozanov, and N. Wermes, "Test results and irradiation performances of 3-D circuits developed in the framework of ATLAS hybrid pixel upgrade," in 2010 IEEE Nuclear Science Symposium Conference Record, 2010, pp. 1551-1555.

Content

Vertex detectors for High Energy Physics experiments require pixel detectors featuring high spatial resolution, very good signal to noise ratio and radiation hardness. A way to face new challenges of ATLAS/SLHC future hybrid pixel vertex detectors is to use the emerging 3-D Integrated Technologies. However, commercial offers of such technologies are only very few and the 3-D designer's choice is then hardly constrained. Moreover, as radiation hardness and specially SEU tolerance of configuration registers is a crucial issue for SLHC vertex detectors and, as commercial data on this point are always missing, a reliable qualification program is to be developed for any candidate technology. We will present the design and test (including radiation tests with 70 kV, 60W X-Ray source and 24 GeV protons) of Chartered, 130nm Low Power 2-D chips realized for this qualification.

Keywords

Detectors

Latches

Layout

MOS devices

Pixel

Radiation effects

Transistors

Notes and references

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