Zitat
P. Schulz and C. Wolff, “Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry,” in 2019 IEEE AUTOTESTCON, Piscataway, NJ: IEEE, 2019, pp. 1–5. doi: 10.1109/autotestcon43700.2019.8961895
Referenzen und Relationen
DOI 10.1109/autotestcon43700.2019.8961895