Quote
P. Schulz and C. Wolff, "Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry," in 2019 IEEE AUTOTESTCON, 2019, pp. 1-5.
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
Fast facts
Internal authorship
Further publishers
Peter Schulz
Publishment
- 2019
Anthology
Cyber Physical Test System - a novel approach in testing for the Embedded Systems Industry
Title of the conference proceedings
2019 IEEE AUTOTESTCON
Organizational unit
Subjects
- Computer science in general
Publication format
Conference paper