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US Patent: US12241991B2

Method for evaluating overlapping targets

Fast facts

  • Internal authorship

  • Further publishers

    Yuliang Sun

  • Publishment

    • USA: United States Patent and Trademark Office (USPTO) 2025
  • Organizational unit

  • Subjects

    • Electrical engineering in general
  • Publication format

    Other publication type

Quote

T. Fei and Y. Sun, "US Patent: US12241991B2." United States Patent and Trademark Office (USPTO), USA, 2025 [Online]. Available: https://image-ppubs.uspto.gov/dirsearch-public/print/downloadPdf/12241991

Content

A method for evaluating overlapping targets in a two-dimensional radar spectrum, wherein the following steps are carried out: providing the two-dimensional radar spectrum, selecting at least one region of interest as an input signal from the spectrum, and performing an evaluation of the input signal to determine an information about the overlapping targets, wherein the evaluation is specific for a model order selection method.

Notes and references

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